发明申请
- 专利标题: IMPEDANCE MATCHING APPARATUS
- 专利标题(中): 阻抗匹配装置
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申请号: US13571167申请日: 2012-08-09
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公开(公告)号: US20120306367A1公开(公告)日: 2012-12-06
- 发明人: Jae Hyun Kim , Sang Won Lee , Yong Gwan Lee
- 申请人: Jae Hyun Kim , Sang Won Lee , Yong Gwan Lee
- 优先权: KR10-2010-0016065 20100223
- 主分类号: H01J19/78
- IPC分类号: H01J19/78
摘要:
Provided is an impedance matching apparatus for matching impedance to a plasma load. The impedance matching apparatus includes a first frequency impedance matching circuit unit that transfers an output of a first frequency RF power source unit, operating at a first frequency, to the plasma load; and a second frequency impedance matching circuit unit that transfers an output of a second frequency RF power source unit, operating at a second frequency higher than the first frequency, to the plasma load. The first frequency impedance matching circuit unit includes a T-type matching circuit, and the second frequency impedance matching circuit unit includes a standard L-type matching circuit or Π-type matching circuit.
公开/授权文献
- US08884520B2 Impedance matching apparatus 公开/授权日:2014-11-11
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