Invention Application
US20120309267A1 METHOD AND APPARATUS FOR MONITORING A POLISHING SURFACE OF A POLISHING PAD USED IN POLISHING APPARATUS
有权
用于监测抛光装置中使用的抛光垫的抛光表面的方法和装置
- Patent Title: METHOD AND APPARATUS FOR MONITORING A POLISHING SURFACE OF A POLISHING PAD USED IN POLISHING APPARATUS
- Patent Title (中): 用于监测抛光装置中使用的抛光垫的抛光表面的方法和装置
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Application No.: US13479575Application Date: 2012-05-24
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Publication No.: US20120309267A1Publication Date: 2012-12-06
- Inventor: Hiroyuki SHINOZAKI , Takahiro SHIMANO , Akira IMAMURA , Akira NAKAMURA
- Applicant: Hiroyuki SHINOZAKI , Takahiro SHIMANO , Akira IMAMURA , Akira NAKAMURA
- Priority: JP2011-124057 20110602
- Main IPC: B24B1/00
- IPC: B24B1/00 ; B24B53/02 ; B24B49/00

Abstract:
The present invention provides a method capable of monitoring the polishing surface of the polishing pad without removing the polishing pad from the polishing table. The method includes: conditioning the polishing surface of the polishing pad by causing a rotating dresser to oscillate on the polishing surface; measuring a height of the polishing surface when the conditioning of the polishing surface is performed; calculating a position of a measuring point of the height on a two-dimensional surface defined on the polishing surface; and repeating the measuring of the height of the polishing surface and the calculating of the position of the measuring point to create height distribution in the polishing surface.
Public/Granted literature
- US09156122B2 Method and apparatus for monitoring a polishing surface of a polishing pad used in polishing apparatus Public/Granted day:2015-10-13
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