发明申请
- 专利标题: SYSTEM AND METHODS TO IMPROVE THE PERFORMANCE OF SEMICONDUCTOR BASED SAMPLING SYSTEM
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申请号: US13155971申请日: 2011-06-08
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公开(公告)号: US20120313667A1公开(公告)日: 2012-12-13
- 发明人: David M. THOMAS
- 申请人: David M. THOMAS
- 专利权人: Linear Technology Corporation
- 当前专利权人: Linear Technology Corporation
- 主分类号: H03K17/687
- IPC分类号: H03K17/687
摘要:
Circuits and methods that improve the performance of electronic sampling systems are provided. Impedances associated with sampling semiconductor switches are maintained substantially constant during sample states, at least in part, by compensating for encountered input signal variations in order to reduce or minimize signal distortion associated with sampled signals that pass through the sampling switch.