Invention Application
US20120319219A1 EPITAXIAL SILICON CMOS-MEMS MICROPHONES AND METHOD FOR MANUFACTURING
有权
外延硅CMOS-MEMS麦克风及其制造方法
- Patent Title: EPITAXIAL SILICON CMOS-MEMS MICROPHONES AND METHOD FOR MANUFACTURING
- Patent Title (中): 外延硅CMOS-MEMS麦克风及其制造方法
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Application No.: US13161194Application Date: 2011-06-15
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Publication No.: US20120319219A1Publication Date: 2012-12-20
- Inventor: Brett M. Diamond , Franz Laermer , Andrew J. Doller , Michael J. Daley , Phillip Sean Stetson , John M. Muza
- Applicant: Brett M. Diamond , Franz Laermer , Andrew J. Doller , Michael J. Daley , Phillip Sean Stetson , John M. Muza
- Applicant Address: DE Stuttgart
- Assignee: ROBERT BOSCH GMBH
- Current Assignee: ROBERT BOSCH GMBH
- Current Assignee Address: DE Stuttgart
- Main IPC: H01L21/20
- IPC: H01L21/20 ; H01L29/84

Abstract:
A method of manufacturing a microphone using epitaxially grown silicon. A monolithic wafer structure is provided. A wafer surface of the structure includes poly-crystalline silicon in a first horizontal region and mono-crystalline silicon in a second horizontal region surrounding a perimeter of the first horizontal region. A hybrid silicon layer is epitaxially deposited on the wafer surface. Portions of the hybrid silicon layer that contact the poly-crystalline silicon use the poly-crystalline silicon as a seed material and portions that contact the mono-crystalline silicon use the mono-crystalline silicon as a seed material. As such, the hybrid silicon layer includes both mono-crystalline silicon and poly-crystalline silicon in the same layer of the same wafer structure. A CMOS/membrane layer is then deposited on top of the hybrid silicon layer.
Public/Granted literature
- US08629011B2 Epitaxial silicon CMOS-MEMS microphones and method for manufacturing Public/Granted day:2014-01-14
Information query
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