Invention Application
- Patent Title: POLY OPENING POLISH PROCESS
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Application No.: US13162776Application Date: 2011-06-17
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Publication No.: US20120322265A1Publication Date: 2012-12-20
- Inventor: Chun-Wei HSU , Po-Cheng Huang , Teng-Chun Tsai , Chia-Lin Hsu , Chih-Hsun Lin , Chang-Hung Kung , Chia-His Chen , Yen-Ming Chen
- Applicant: Chun-Wei HSU , Po-Cheng Huang , Teng-Chun Tsai , Chia-Lin Hsu , Chih-Hsun Lin , Chang-Hung Kung , Chia-His Chen , Yen-Ming Chen
- Applicant Address: TW HSINCHU
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW HSINCHU
- Main IPC: H01L21/304
- IPC: H01L21/304 ; H01L21/306

Abstract:
A poly opening polish process includes the following steps. A semi-finished semiconductor component is provided. The semi-finished semiconductor component includes a substrate, a gate disposed on the substrate, and a dielectric layer disposed on the substrate and covering the gate. A first polishing process is applied onto the dielectric layer. A second polishing process is applied to the gate. The second polishing process utilizes a wetting solution including a water soluble polymer surfactant, an alkaline compound and water. The poly opening polish process can effectively remove an oxide residue formed in the chemical mechanical polish, thereby improving the performance of the integrated circuit and reducing the production cost of the integrated circuit.
Public/Granted literature
- US08513128B2 Poly opening polish process Public/Granted day:2013-08-20
Information query
IPC分类: