发明申请
- 专利标题: INTERCONNECT STRUCTURES WITH ENGINEERED DIELECTRICS WITH NANOCOLUMNAR POROSITY
- 专利标题(中): 具有纳米孔隙度的工程电介质的互连结构
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申请号: US11899842申请日: 2007-09-07
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公开(公告)号: US20130009315A1公开(公告)日: 2013-01-10
- 发明人: Matthew E. Colburn , Satya V. Nitta , Sampath Purushothaman , Charles Black , Kathryn Guarini
- 申请人: Matthew E. Colburn , Satya V. Nitta , Sampath Purushothaman , Charles Black , Kathryn Guarini
- 主分类号: H01L23/522
- IPC分类号: H01L23/522 ; H01L21/768
摘要:
A method for forming an interconnect structure with nanocolumnar intermetal dielectric is described involving the construction of an interconnect structure using a solid dielectric, and introducing a regular array of vertically aligned nanoscale pores through stencil formation and etching to form a hole array and subsequently pinching off the tops of the hole array with a cap dielectric. Variations of the method and means to construct a multilevel nanocolumnar interconnect structure are also described.
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