发明申请
- 专利标题: FORMING GROUNDED THROUGH-SILICON VIAS IN A SEMICONDUCTOR SUBSTRATE
- 专利标题(中): 在半导体衬底中形成通孔硅
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申请号: US13178079申请日: 2011-07-07
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公开(公告)号: US20130009317A1公开(公告)日: 2013-01-10
- 发明人: Chi-Chun HSIEH , Wei-Cheng WU , Hsiao-Tsung YEN , Hsien-Pin HU , Shang-Yun HOU , Shin-Puu JENG
- 申请人: Chi-Chun HSIEH , Wei-Cheng WU , Hsiao-Tsung YEN , Hsien-Pin HU , Shang-Yun HOU , Shin-Puu JENG
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW Hsinchu
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H01L21/283
摘要:
A method of forming an interposer includes providing a semiconductor substrate, the semiconductor substrate having a front surface and a back surface opposite the front surface; forming one or more through-silicon vias (TSVs) extending from the front surface into the semiconductor substrate; forming an inter-layer dielectric (ILD) layer overlying the front surface of the semiconductor substrate and the one or more TSVs; and forming an interconnect structure in the ILI) layer, the interconnect structure electrically connecting the one or more TSVs to the semiconductor substrate.
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