发明申请
- 专利标题: STRUCTURE AND METHOD FOR HIGH PERFORMANCE INTERCONNECT
- 专利标题(中): 高性能互连的结构和方法
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申请号: US13182368申请日: 2011-07-13
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公开(公告)号: US20130015581A1公开(公告)日: 2013-01-17
- 发明人: Hsingjen Wann , Ting-Chu Ko
- 申请人: Hsingjen Wann , Ting-Chu Ko
- 申请人地址: TW Hsin-Chu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW Hsin-Chu
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H01L21/768
摘要:
The present disclosure provides an integrated circuit structure. The integrated circuit structure includes a substrate having an IC device formed therein; a first dielectric material layer disposed on the substrate and having a first trench formed therein; and a first composite interconnect feature disposed in the first trench and electrically coupled with the IC device. The first composite interconnect feature includes a first barrier layer disposed on sidewalls of the first trench; a first metal layer disposed on the first barrier layer; and a first graphene layer disposed on the metal layer.
公开/授权文献
- US08716863B2 Structure and method for high performance interconnect 公开/授权日:2014-05-06
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