发明申请
- 专利标题: SAMPLE ANALYZER AND SAMPLE ANALYSIS SYSTEM
- 专利标题(中): 样品分析仪和样品分析系统
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申请号: US13629081申请日: 2012-09-27
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公开(公告)号: US20130022499A1公开(公告)日: 2013-01-24
- 发明人: Toru MIZUMOTO , Takayoshi IZUMI , Keisuke TSUTSUMIDA , Shinya NAKAJIMA
- 申请人: Toru MIZUMOTO , Takayoshi IZUMI , Keisuke TSUTSUMIDA , Shinya NAKAJIMA
- 申请人地址: JP Kyoto-shi JP Kobe-shi
- 专利权人: ARKRAY, INC.,SYSMEX CORPORATION
- 当前专利权人: ARKRAY, INC.,SYSMEX CORPORATION
- 当前专利权人地址: JP Kyoto-shi JP Kobe-shi
- 优先权: JP2010-076525 20100330; JP2010-125142 20100531
- 主分类号: G01N35/00
- IPC分类号: G01N35/00
摘要:
A sample analyzer which transports a rack holding a plurality of sample containers and analyzes samples includes: a first measurement apparatus which measures samples; a second measurement apparatus which is arranged downstream, in a transport direction, from the first measurement apparatus, and which measures samples; and a transporting apparatus which transports samples to a first supply position for supplying a sample to the first measurement apparatus, and to a second supply position for supplying a sample to the second measurement apparatus. The transporting apparatus linearly transports a rack from the first supply position to the second supply position, and the distance between the first supply position and the second supply position is a multiple of the distance between adjacent sample containers held in the rack.
公开/授权文献
- US08641988B2 Sample analyzer and sample analysis system 公开/授权日:2014-02-04
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