发明申请
US20130037723A1 X-RAY DETECTOR WITH IMPROVED SPATIAL GAIN UNIFORMITY AND RESOLUTION AND METHOD OF FABRICATING SUCH X-RAY DETECTOR
有权
具有改进的空间增益均匀性和分辨率的X射线探测器以及制造这种X射线探测器的方法
- 专利标题： X-RAY DETECTOR WITH IMPROVED SPATIAL GAIN UNIFORMITY AND RESOLUTION AND METHOD OF FABRICATING SUCH X-RAY DETECTOR
- 专利标题（中）： 具有改进的空间增益均匀性和分辨率的X射线探测器以及制造这种X射线探测器的方法
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申请号： US13642861申请日： 2011-04-19
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公开(公告)号： US20130037723A1公开(公告)日： 2013-02-14
- 发明人: Coen Adrianus Verschuren , Heidrun Steinhauser , Tiemen Poorter , Hugo Johan Cornelissen
- 申请人： Coen Adrianus Verschuren , Heidrun Steinhauser , Tiemen Poorter , Hugo Johan Cornelissen
- 申请人地址： NL EINDHOVEN
- 专利权人： KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人： KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人地址： NL EINDHOVEN
- 优先权： EP10160988.1 20100426
- 国际申请： PCT/IB11/51681 WO 20110419
- 主分类号： G01T1/20
- IPC分类号： G01T1/20 ; H01L33/60
摘要：
An X-raydetector (1) is proposed comprising a light detection arrangement (3) such as a CMOS photodetector, a scintillator layer (5) such as a CsI:T1 layer, a reflector layer (9) and a light emission layer (7) interposed between the scintillator layer (5) and the reflector layer (9). The light emission layer (7) may comprise an OLED and may be made with a thickness of less than 50 μm. Thereby, a sensitivity and resolution of the X-raydetector may be improved.
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