A test circuit includes two probes, a comparison circuit, a switch circuit, and an indication circuit. The probes are connected to an electronic component to be tested, and a low level signal is output if the electronic component is short-circuited. The comparison circuit outputs a comparison signal based on the shorting signal from the probes. The switch circuit outputs a switch signal based on the comparison signal from the comparison circuit. The indication circuit indicates that the electronic component is short-circuited or not short-circuited based on the switch signal fro m the switch circuit.