发明申请
- 专利标题： MANAGEMENT OF STORAGE OF MEASUREMENT DATA
- 专利标题（中）： 存储测量数据的管理
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申请号： US13642663申请日： 2011-04-29
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公开(公告)号： US20130040659A1公开(公告)日： 2013-02-14
- 发明人: Himke Van Der Velde , Gert Jan Van Lieshout , Kyeong In Jeong
- 申请人： Himke Van Der Velde , Gert Jan Van Lieshout , Kyeong In Jeong
- 申请人地址： KR Suwon-si, Gyeonggi-do
- 专利权人： SAMSUNG ELECTRONICS CO. LTD.
- 当前专利权人： SAMSUNG ELECTRONICS CO. LTD.
- 当前专利权人地址： KR Suwon-si, Gyeonggi-do
- 优先权： GB1007293.2 20100430
- 国际申请： PCT/KR11/03210 WO 20110429
- 主分类号： H04W24/00
- IPC分类号： H04W24/00
摘要：
A management of storage of measurement Data is provided. A method of managing storage of a set of measurement data comprises the steps of determining whether a value of at least one of said plurality of parameters has changed by more than a threshold amount from a value of the parameter in a previously stored set of measurement data and storing the set of measurement data, dependent upon the determination being affirmative.
公开/授权文献
- US09232424B2 Management of storage of measurement data 公开/授权日：2016-01-05
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