发明申请
- 专利标题： System and Method Utilizing Time-Slice-Eradication to Eliminate the Effects of Wavelength Non-Linearities from Swept-Wavelength Testing of Optical Components for Sources with Non-Linearities
- 专利标题（中）： 系统和方法利用时间切除消除波长非线性对来自非线性源的光学部件的扫描波长测试的影响
-
申请号： US13555105申请日： 2012-07-21
-
公开(公告)号： US20130046499A1公开(公告)日： 2013-02-21
- 发明人: Michael Minneman , Michael Crawford , Jason Ensher
- 申请人： Michael Minneman , Michael Crawford , Jason Ensher
- 申请人地址： US CO Lafayette
- 专利权人： INSIGHT PHOTONIC SOLUTIONS, INC.
- 当前专利权人： INSIGHT PHOTONIC SOLUTIONS, INC.
- 当前专利权人地址： US CO Lafayette
- 主分类号： G06F15/00
- IPC分类号： G06F15/00 ; H01S5/06
摘要：
A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.
公开/授权文献
信息查询
