Invention Application
- Patent Title: IMPEDANCE CALIBRATION CIRCUIT AND METHOD
- Patent Title (中): 阻抗校准电路和方法
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Application No.: US13218134Application Date: 2011-08-25
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Publication No.: US20130049797A1Publication Date: 2013-02-28
- Inventor: Mayank Kumar SINGH , Daljeet KUMAR , Hiten ADVANI
- Applicant: Mayank Kumar SINGH , Daljeet KUMAR , Hiten ADVANI
- Applicant Address: IN Greater NOIDA
- Assignee: STMicronelectronics Pvt. Ltd.
- Current Assignee: STMicronelectronics Pvt. Ltd.
- Current Assignee Address: IN Greater NOIDA
- Main IPC: H03K19/003
- IPC: H03K19/003
Abstract:
An embodiment of an impedance calibration circuit and method, a device including an impedance calibration circuit, and a transmission link system.
Public/Granted literature
- US08581619B2 Impedance calibration circuit and method Public/Granted day:2013-11-12
Information query
