Invention Application
US20130065472A1 DEFECT DETECTION METHOD OF DISPLAY DEVICE AND DEFECT DETECTION APPARATUS OF DISPLAY DEVICE 有权
显示装置的缺陷检测方法和显示装置的缺陷检测装置

DEFECT DETECTION METHOD OF DISPLAY DEVICE AND DEFECT DETECTION APPARATUS OF DISPLAY DEVICE
Abstract:
A defect detecting method of a display device includes a defect counting process that measuring a feature amount for each partial region of a display device (P32), and counting regions which is determined as a defective portion based on the measured feature amount of the region (P36), a process that stopping a manufacturing line of the display device when a number of defects counted at the defect counting process is greater than a first threshold value (P38, P42), a defect density calculating process that calculating a defect density in a predetermined area when the number of defects counted at the defect counting process is smaller than the first threshold value (P38), and a process that stopping the manufacturing line of the display device when the defect density calculated at the defect density calculating process is higher than a second threshold value (P40, P42).
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