- 专利标题: Perpendicular spin torque oscillator FMR frequency measurement method
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申请号: US13200148申请日: 2011-09-19
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公开(公告)号: US20130069626A1公开(公告)日: 2013-03-21
- 发明人: Yuchen Zhou , Kunliang Zhang , Min Li , Kenichi Takano , Joe Smyth , Moris Dovek , Akihiko Takeo , Tomomi Funayama , Masahiro Takashita , Masayuki Takagishi
- 申请人: Yuchen Zhou , Kunliang Zhang , Min Li , Kenichi Takano , Joe Smyth , Moris Dovek , Akihiko Takeo , Tomomi Funayama , Masahiro Takashita , Masayuki Takagishi
- 专利权人: TDK Corporation & Kabushiki Kaisha Toshiba
- 当前专利权人: TDK Corporation & Kabushiki Kaisha Toshiba
- 主分类号: G01R23/02
- IPC分类号: G01R23/02
摘要:
A method for measuring the frequency in a spin torque oscillator having at least a magnetic oscillation layer (MOL), junction layer, and magnetic reference layer (MRL) is disclosed. In a first embodiment, a small in-plane magnetic field is applied to the STO after a DC current is applied to excite the MOL into an oscillation state. The MRL has a perpendicular magnetization that is tilted slightly to give an in-plane magnetization component to serve as a reference layer for measuring the oscillation frequency of the MOL in-plane magnetization component. An AC voltage change is produced in the DC current as a result of variable STO resistance and directly correlates to MOL oscillation frequency. Alternatively, a field having both perpendicular and in-plane components may be applied externally or by forming the STO between two magnetic poles thereby producing an in-plane magnetization reference component in the MRL.
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