发明申请
- 专利标题: SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- 专利标题(中): 半导体器件及其制造方法
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申请号: US13541954申请日: 2012-07-05
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公开(公告)号: US20130075929A1公开(公告)日: 2013-03-28
- 发明人: Masayuki Katagiri , Yuichi Yamazaki , Makoto Wada , Tadashi Sakai , Naoshi Sakuma , Mariko Suzuki
- 申请人: Masayuki Katagiri , Yuichi Yamazaki , Makoto Wada , Tadashi Sakai , Naoshi Sakuma , Mariko Suzuki
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 优先权: JP2011-210972 20110927
- 主分类号: H01L21/768
- IPC分类号: H01L21/768 ; H01L23/522 ; B82Y99/00 ; B82Y40/00
摘要:
A semiconductor device of an embodiment includes: a substrate; a first catalytic metal film on the substrate; graphene on the first catalytic metal film; an interlayer insulating film on the graphene; a contact hole penetrating through the interlayer insulating film; a conductive film at the bottom portion of the contact hole, the conductive film being electrically connected to the graphene; a second catalytic metal film on the conductive film, the second catalytic metal film being subjected to plasma processing with at least one kind of gas selected from hydrogen, nitrogen, ammonia, and rare gas; and carbon nanotubes on the second catalytic metal film.
公开/授权文献
- US08710672B2 Semiconductor device and method of manufacturing the same 公开/授权日:2014-04-29
信息查询
IPC分类: