发明申请
US20130087702A1 ASSEMBLY FOR PROVIDING AN ALIGNED STACK OF TWO OR MORE MODULES AND A LITHOGRAPHY SYSTEM OR A MICROSCOPY SYSTEM COMPRISING SUCH AN ASSEMBLY 有权
用于提供两个或更多个模块的对齐堆叠的组件以及包含这样组装的显微系统或显微系统

  • 专利标题: ASSEMBLY FOR PROVIDING AN ALIGNED STACK OF TWO OR MORE MODULES AND A LITHOGRAPHY SYSTEM OR A MICROSCOPY SYSTEM COMPRISING SUCH AN ASSEMBLY
  • 专利标题(中): 用于提供两个或更多个模块的对齐堆叠的组件以及包含这样组装的显微系统或显微系统
  • 申请号: US13612498
    申请日: 2012-09-12
  • 公开(公告)号: US20130087702A1
    公开(公告)日: 2013-04-11
  • 发明人: Pieter Kappelhof
  • 申请人: Pieter Kappelhof
  • 主分类号: A47B55/00
  • IPC分类号: A47B55/00 G21K1/06
ASSEMBLY FOR PROVIDING AN ALIGNED STACK OF TWO OR MORE MODULES AND A LITHOGRAPHY SYSTEM OR A MICROSCOPY SYSTEM COMPRISING SUCH AN ASSEMBLY
摘要:
The invention relates to an assembly, preferably for use in a lithography system or a microscopy system, for providing an accurately aligned stack of two or more modules in a stacking direction. Each of the two or more modules comprises three support members. The assembly comprises a frame comprising three planar alignment surfaces which extend in the stacking direction and which are angularly off-set with respect to each other. In addition each of the three support members of each one of the two or more modules, when arranged in said frame, abuts against a corresponding one of the three alignment surfaces. The frame is provided with an opening between two of the three planar alignment surfaces for inserting a module in the assembly, said two planar alignment surfaces on either side of the opening are arranged at least partially facing said opening.
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