发明申请
- 专利标题: ELECTRICAL PARAMETER DETECTION DEVICE FOR PERIPHERAL COMPONENT INTERCONNECT DEVICES
- 专利标题(中): 用于外围元件互连器件的电气参数检测装置
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申请号: US13424394申请日: 2012-03-20
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公开(公告)号: US20130127447A1公开(公告)日: 2013-05-23
- 发明人: YA-JUN PAN , QI-YAN LUO , PENG CHEN , SONG-LIN TONG
- 申请人: YA-JUN PAN , QI-YAN LUO , PENG CHEN , SONG-LIN TONG
- 申请人地址: TW Tu-Cheng CN Shenzhen City
- 专利权人: HON HAI PRECISION INDUSTRY CO., LTD.,HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- 当前专利权人: HON HAI PRECISION INDUSTRY CO., LTD.,HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- 当前专利权人地址: TW Tu-Cheng CN Shenzhen City
- 优先权: CN201110370981.5 20111121
- 主分类号: G01P3/42
- IPC分类号: G01P3/42
摘要:
An electrical parameter detection device is configured for detecting electrical parameters of a peripheral component interconnect (PCI) connector including a plurality of power pins. The electrical parameter detection device includes a processor module, a first detection module, and a second detection module. The processor module continuously detects voltage values of electric potentials provided by each of the power pins of the PCI connector using the first detection module, and determines time sequences of the electric potentials according to the voltage values of the electric potentials. Furthermore, the processor module detects the amount of power provided by each of the power pins of the PCI connector using the second detection module.
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