发明申请
US20130151914A1 FLASH ARRAY BUILT IN SELF TEST ENGINE WITH TRACE ARRAY AND FLASH METRIC REPORTING
有权
闪存阵列用自动测试引擎内置跟踪阵列和闪存公制报告
- 专利标题： FLASH ARRAY BUILT IN SELF TEST ENGINE WITH TRACE ARRAY AND FLASH METRIC REPORTING
- 专利标题（中）： 闪存阵列用自动测试引擎内置跟踪阵列和闪存公制报告
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申请号： US13314657申请日： 2011-12-08
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公开(公告)号： US20130151914A1公开(公告)日： 2013-06-13
- 发明人: David D. Cadigan , Thomas J. Griffin , Archana Shetty , Gary A. Tressler , Dustin J. Vanstee
- 申请人： David D. Cadigan , Thomas J. Griffin , Archana Shetty , Gary A. Tressler , Dustin J. Vanstee
- 申请人地址： US NY Armonk
- 专利权人： INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人： INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址： US NY Armonk
- 主分类号： G11C29/12
- IPC分类号： G11C29/12 ; G06F11/27
摘要：
A mechanism is provided for a flash array test engine. The flash array test engine includes a circuit. The circuit is configured to generate test workloads in a test mode for testing a flash device array, where each of the test workloads includes specific addresses, data, and command patterns to be sent to the flash device array. The circuit is configured to accelerate wear in the flash device array, via the test workloads, at an accelerated rate relative to general system workloads that are not part of the test mode. The circuit is configured to vary a range of conditions for the flash device array to determine whether each of the conditions passes or fails and to store failure data and corresponding failure data address information for the flash device array.
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