发明申请
- 专利标题: DEVICE FOR MEASURING THREE DIMENSIONAL SHAPE
- 专利标题(中): 用于测量三维形状的装置
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申请号: US13558842申请日: 2012-07-26
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公开(公告)号: US20130155416A1公开(公告)日: 2013-06-20
- 发明人: Nobuyuki Umemura , Takahiro Mamiya , Hiroyuki Ishigaki
- 申请人: Nobuyuki Umemura , Takahiro Mamiya , Hiroyuki Ishigaki
- 申请人地址: JP Aichi
- 专利权人: CKD CORPORATION
- 当前专利权人: CKD CORPORATION
- 当前专利权人地址: JP Aichi
- 优先权: JP2011-273985 20111215
- 主分类号: G01B11/25
- IPC分类号: G01B11/25
摘要:
A device for measuring three dimensional shape is configured to perform one of a first imaging operation as imaging processing of a single operation among a multiplicity of imaging operations performed by irradiation of a first light pattern of multiply varied phases, and a second imaging operation as imaging processing of a single operation among a multiplicity of imaging operations performed by irradiation of a second light pattern of multiply varied phases. The device is configured to, simultaneous with completion of the first or second imaging operation, start shifting or switching operation of said first grating or a second grating relating to said first imaging operation. The device is configured to, without waiting for completion of the shifting or switching operation, perform the other imaging operation from among the first and second imaging operations.
公开/授权文献
- US08896845B2 Device for measuring three dimensional shape 公开/授权日:2014-11-25
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