Device for measuring three dimensional shape
    1.
    发明授权
    Device for measuring three dimensional shape 有权
    用于测量三维形状的装置

    公开(公告)号:US08896845B2

    公开(公告)日:2014-11-25

    申请号:US13558842

    申请日:2012-07-26

    IPC分类号: G01B11/24

    CPC分类号: G01B11/2509 G01B11/2513

    摘要: A device for measuring three dimensional shape is configured to perform one of a first imaging operation as imaging processing of a single operation among a multiplicity of imaging operations performed by irradiation of a first light pattern of multiply varied phases, and a second imaging operation as imaging processing of a single operation among a multiplicity of imaging operations performed by irradiation of a second light pattern of multiply varied phases. The device is configured to, simultaneous with completion of the first or second imaging operation, start shifting or switching operation of said first grating or a second grating relating to said first imaging operation. The device is configured to, without waiting for completion of the shifting or switching operation, perform the other imaging operation from among the first and second imaging operations.

    摘要翻译: 用于测量三维形状的装置被配置为执行第一成像操作中的一个,作为通过照射多重相位的第一光图案执行的多次成像操作中的单个操作的成像处理,以及作为成像的第二成像操作 在通过多相变化的相位的第二光图案的照射进行的多次成像操作中处理单个操作。 该装置被配置为,与完成第一或第二成像操作同时开始移动或切换所述第一光栅或与所述第一成像操作相关的第二光栅的操作。 该设备被配置为在不等待完成移位或切换操作的情况下,从第一和第二成像操作中执行另一个成像操作。

    DEVICE FOR MEASURING THREE DIMENSIONAL SHAPE
    2.
    发明申请
    DEVICE FOR MEASURING THREE DIMENSIONAL SHAPE 有权
    用于测量三维形状的装置

    公开(公告)号:US20130155416A1

    公开(公告)日:2013-06-20

    申请号:US13558842

    申请日:2012-07-26

    IPC分类号: G01B11/25

    CPC分类号: G01B11/2509 G01B11/2513

    摘要: A device for measuring three dimensional shape is configured to perform one of a first imaging operation as imaging processing of a single operation among a multiplicity of imaging operations performed by irradiation of a first light pattern of multiply varied phases, and a second imaging operation as imaging processing of a single operation among a multiplicity of imaging operations performed by irradiation of a second light pattern of multiply varied phases. The device is configured to, simultaneous with completion of the first or second imaging operation, start shifting or switching operation of said first grating or a second grating relating to said first imaging operation. The device is configured to, without waiting for completion of the shifting or switching operation, perform the other imaging operation from among the first and second imaging operations.

    摘要翻译: 用于测量三维形状的装置被配置为执行第一成像操作中的一个,作为通过照射多重相位的第一光图案执行的多次成像操作中的单个操作的成像处理,以及作为成像的第二成像操作 在通过多相变化的相位的第二光图案的照射进行的多次成像操作中处理单个操作。 该装置被配置为,与完成第一或第二成像操作同时开始移动或切换所述第一光栅或与所述第一成像操作相关的第二光栅的操作。 该设备被配置为在不等待完成移位或切换操作的情况下,从第一和第二成像操作中执行另一个成像操作。

    Three-dimensional measuring device
    3.
    发明授权
    Three-dimensional measuring device 有权
    三维测量装置

    公开(公告)号:US08224070B2

    公开(公告)日:2012-07-17

    申请号:US12688552

    申请日:2010-01-15

    IPC分类号: G06K9/00 G06K9/66

    CPC分类号: G01B11/0608 G01B11/03

    摘要: A three-dimensional measuring device includes an irradiation device configured to irradiate and switch among a multiplicity of light patterns having different periods and having a striped light intensity distribution on at least a measurement object, a camera having an imaging element capable of imaging reflected light from the measurement object irradiated by the light pattern, a rack configured to cause relative change in positional relationship between the imaging element and the measurement object, and a control device configured to perform three-dimensional measurements based on image data imaged by the camera. The control device performs the three-dimensional measurements by performing a phase shift method calculation of height data as a first height data for each pixel unit of image data based on a multiply phase-shifted image data obtained by irradiating on a first position a multiply phase-shifted first light pattern having a first period.

    摘要翻译: 一种三维测量装置,包括:照射装置,被配置为在具有不同周期的多个光图案中至少对测量对象进行条纹光强度分布的照射和切换;具有能够对来自 由光图案照射的测量对象,被配置为引起成像元件和测量对象之间的位置关系的相对变化的支架,以及被配置为基于由相机拍摄的图像数据执行三维测量的控制装置。 控制装置通过对基于图像数据的每个像素单位的第一高度数据进行相移方法计算,执行三维测量,所述相移移位方法基于通过在第一位置照射多相 转换的第一光图案具有第一周期。

    THREE-DIMENSIONAL MEASURING DEVICE
    4.
    发明申请
    THREE-DIMENSIONAL MEASURING DEVICE 有权
    三维测量装置

    公开(公告)号:US20100183194A1

    公开(公告)日:2010-07-22

    申请号:US12688552

    申请日:2010-01-15

    IPC分类号: G06K9/62

    CPC分类号: G01B11/0608 G01B11/03

    摘要: A three-dimensional measuring device includes an irradiation device configured to irradiate and switch among a multiplicity of light patterns having different periods and having a striped light intensity distribution on at least a measurement object, a camera having an imaging element capable of imaging reflected light from the measurement object irradiated by the light pattern, a rack configured to cause relative change in positional relationship between the imaging element and the measurement object, and a control device configured to perform three-dimensional measurements based on image data imaged by the camera. The control device performs the three-dimensional measurements by performing a phase shift method calculation of height data as a first height data for each pixel unit of image data based on a multiply phase-shifted image data obtained by irradiating on a first position a multiply phase-shifted first light pattern having a first period.

    摘要翻译: 一种三维测量装置,包括:照射装置,被配置为在具有不同周期的多个光图案中至少对测量对象进行条纹光强度分布的照射和切换;具有能够对来自 由光图案照射的测量对象,被配置为引起成像元件和测量对象之间的位置关系的相对变化的支架,以及被配置为基于由相机拍摄的图像数据执行三维测量的控制装置。 控制装置通过对基于图像数据的每个像素单位的第一高度数据进行相移方法计算,执行三维测量,所述相移移位方法基于通过在第一位置照射多相 转换的第一光图案具有第一周期。

    DEVICE FOR MEASURING THREE DIMENSIONAL SHAPE
    5.
    发明申请
    DEVICE FOR MEASURING THREE DIMENSIONAL SHAPE 有权
    用于测量三维形状的装置

    公开(公告)号:US20130128282A1

    公开(公告)日:2013-05-23

    申请号:US13559881

    申请日:2012-07-27

    申请人: Hiroyuki Ishigaki

    发明人: Hiroyuki Ishigaki

    IPC分类号: G01B11/25

    摘要: A device for measuring three dimensional shape includes a first height data acquisition unit for acquiring a height data specified from measurement values according to a multiplicity of light patterns related to an entirely irradiated region irradiated by all of the multiplicity of light patterns, and for using an acquired specified height data as a height data for the entirely irradiated region; a supplemental data acquisition unit for acquiring, based on the height data for the entirely irradiated region, a supplemental data relating to a partially irradiated region that is irradiated by only part of the multiplicity of light patterns; and a second height acquisition unit for specifying a fringe order of the measurement values for the partially irradiated region based on the supplemental data, and for acquiring as height data for the partially irradiated region a height data corresponding to the measurement values of the specified fringe order.

    摘要翻译: 一种用于测量三维形状的装置包括:第一高度数据获取单元,用于根据与由所有多个光图案照射的完全照射区域有关的多个光图案获取由测量值指定的高度数据,并且使用 获取指定高度数据作为完全照射区域的高度数据; 补充数据获取单元,用于基于完全照射区域的高度数据获取与仅由多个光图案的一部分照射的部分照射区域有关的补充数据; 以及第二高度获取单元,用于基于补充数据指定部分照射区域的测量值的条纹顺序,并且用于获取与部分照射区域的高度数据相对应的指定条纹顺序的测量值的高度数据 。

    Board inspection apparatus
    6.
    发明授权
    Board inspection apparatus 有权
    板检测仪

    公开(公告)号:US09250198B2

    公开(公告)日:2016-02-02

    申请号:US13458241

    申请日:2012-04-27

    申请人: Hiroyuki Ishigaki

    发明人: Hiroyuki Ishigaki

    IPC分类号: H04N7/18 G01N21/956 H05K3/34

    摘要: A board inspection apparatus includes an irradiation unit, an imaging unit, and an image processing unit. The image processing unit includes a three-dimensional measurement unit configured to perform three-dimensional measurement of the surfaces of the solder and the resist film by a certain three-dimensional measurement method based on the image data, a virtual standard surface setting unit configured to set a virtual standard surface corresponding to a contacting surface of a certain component mounted in a certain area of the printed board, a protrusion amount calculation unit configured to calculate a protrusion amount from the virtual standard surface for each solder printed and formed in the certain area, and a determination unit configured to determine whether the printed state of the solder passes or fails based on each of the protrusion amounts of the solder.

    摘要翻译: 板检查装置包括照射单元,成像单元和图像处理单元。 图像处理单元包括:三维测量单元,被配置为基于图像数据通过一定的三维测量方法对焊料和抗蚀剂膜的表面进行三维测量;虚拟标准表面设置单元,被配置为 设置对应于安装在印刷电路板的特定区域中的某个部件的接触表面的虚拟标准表面;突出量计算单元,被配置为从在所述特定区域中印刷和形成的每个焊料的虚拟标准表面计算出突出量 以及确定单元,被配置为基于焊料的每个突出量来确定焊料的打印状态是否通过或失败。

    Method for measuring mirror index and apparatus thereof
    7.
    发明授权
    Method for measuring mirror index and apparatus thereof 失效
    测量镜面指标的方法及其装置

    公开(公告)号:US08238641B2

    公开(公告)日:2012-08-07

    申请号:US12213590

    申请日:2008-06-20

    摘要: There is provided a method of evaluating quantitatively surface properties such as cleanness and quality of the surface of a work that has been evaluated in the past by visual appearance inspection. A determined pattern 14 is made from plural concentric circles arranged at a center of an object lens in a taking picture device 12. A front edge of a probe is in contact with the surface of a work by the probe 10 that is provided at a middle portion of a cylindrical case 11 in a vertical direction so that the surface of the work and the determined pattern face each other. The determined pattern is illuminated by light of a light source so that a reflected image of the determined pattern is projected onto the surface of the work. A picture of the reflected image is taken by the taking picture device. The resulted image data includes standard deviation of brightness distribution of the resulted image data positioned on radius lines extending in all directions to outside from a center of the ring pattern image. A relative value between the resulted standard deviation and the standard deviation of the amplitude of the brightness distribution of the image data on a plurality of lines of the criteria mirror surface is determined as the mirror index. The image clarity of the surface of the work is evaluated from the mirror index of the plurality of lines.

    摘要翻译: 提供了一种定量评估过去通过视觉外观检查评估的工作表面的清洁度和质量的定量表征性质的方法。 确定的图案14由布置在拍摄装置12中的物镜的中心处的多个同心圆制成。探针的前边缘通过设置在中间的探针10与工件的表面接触 圆柱形壳体11的垂直方向的一部分,使得工件的表面和确定的图案彼此面对。 所确定的图案由光源的光照亮,使得所确定的图案的反射图像投影到作品的表面上。 拍摄装置拍摄反射图像的图像。 所得到的图像数据包括位于在从环形图案图像的中心向所有方向延伸到外部的半径线上的所得到的图像数据的亮度分布的标准偏差。 确定所得到的标准偏差与标准镜面的多行上的图像数据的亮度分布的幅度的标准偏差之间的相对值作为镜像索引。 根据多行的镜像索引来评估作品表面的图像清晰度。

    Method for measuring mirror index and apparatus thereof
    8.
    发明申请
    Method for measuring mirror index and apparatus thereof 失效
    测量镜面指标的方法及其装置

    公开(公告)号:US20090316959A1

    公开(公告)日:2009-12-24

    申请号:US12213590

    申请日:2008-06-20

    IPC分类号: G06K9/00

    摘要: There is provided a method of evaluating quantitatively surface properties such as cleanness and quality of the surface of a work that has been evaluated in the past by visual appearance inspection. A determined pattern 14 is made from plural concentric circles arranged at a center of an object lens in a taking picture device 12. A front edge of a probe is in contact with the surface of a work by the probe 10 that is provided at a middle portion of a cylindrical case 11 in a vertical direction so that the surface of the work and the determined pattern face each other. The determined pattern is illuminated by light of a light source so that a reflected image of the determined pattern is projected onto the surface of the work. A picture of the reflected image is taken by the taking picture device. The resulted image data includes standard deviation of brightness distribution of the resulted image data positioned on radius lines extending in all directions to outside from a center of the ring pattern image. A relative value between the resulted standard deviation and the standard deviation of the amplitude of the brightness distribution of the image data on a plurality of lines of the criteria mirror surface is determined as the mirror index. The image clarity of the surface of the work is evaluated from the mirror index of the plurality of lines.

    摘要翻译: 提供了一种定量评估过去通过视觉外观检查评估的工作表面的清洁度和质量的定量表征性质的方法。 确定的图案14由布置在拍摄装置12中的物镜的中心处的多个同心圆制成。探针的前边缘通过设置在中间的探针10与工件的表面接触 圆柱形壳体11的垂直方向的一部分,使得工件的表面和确定的图案彼此面对。 所确定的图案由光源的光照亮,使得所确定的图案的反射图像投影到作品的表面上。 拍摄装置拍摄反射图像的图像。 所得到的图像数据包括位于在从环形图案图像的中心向所有方向延伸到外部的半径线上的所得到的图像数据的亮度分布的标准偏差。 确定所得到的标准偏差与标准镜面的多行上的图像数据的亮度分布的幅度的标准偏差之间的相对值作为镜像索引。 根据多行的镜像索引来评估作品表面的图像清晰度。

    Device for measuring three dimensional shape
    9.
    发明授权
    Device for measuring three dimensional shape 有权
    用于测量三维形状的装置

    公开(公告)号:US08693007B2

    公开(公告)日:2014-04-08

    申请号:US13559881

    申请日:2012-07-27

    申请人: Hiroyuki Ishigaki

    发明人: Hiroyuki Ishigaki

    IPC分类号: G01B11/24

    摘要: A device for measuring three dimensional shape includes a first height data acquisition unit for acquiring a height data specified from measurement values according to a multiplicity of light patterns related to an entirely irradiated region irradiated by all of the multiplicity of light patterns, and for using an acquired specified height data as a height data for the entirely irradiated region; a supplemental data acquisition unit for acquiring, based on the height data for the entirely irradiated region, a supplemental data relating to a partially irradiated region that is irradiated by only part of the multiplicity of light patterns; and a second height acquisition unit for specifying a fringe order of the measurement values for the partially irradiated region based on the supplemental data, and for acquiring as height data for the partially irradiated region a height data corresponding to the measurement values of the specified fringe order.

    摘要翻译: 一种用于测量三维形状的装置包括:第一高度数据获取单元,用于根据与由所有多个光图案照射的完全照射区域有关的多个光图案获取由测量值指定的高度数据,并且使用 获取指定高度数据作为完全照射区域的高度数据; 补充数据获取单元,用于基于完全照射区域的高度数据获取与仅由多个光图案的一部分照射的部分照射区域有关的补充数据; 以及第二高度获取单元,用于基于补充数据指定部分照射区域的测量值的条纹顺序,并且用于获取与部分照射区域的高度数据相对应的指定条纹顺序的测量值的高度数据 。

    THREE-DIMENSIONAL MEASURING DEVICE
    10.
    发明申请
    THREE-DIMENSIONAL MEASURING DEVICE 审中-公开
    三维测量装置

    公开(公告)号:US20100177192A1

    公开(公告)日:2010-07-15

    申请号:US12686870

    申请日:2010-01-13

    申请人: Hiroyuki Ishigaki

    发明人: Hiroyuki Ishigaki

    摘要: A three-dimensional measuring device has an irradiation device that irradiates a light pattern having a striped light intensity distribution on a measurement object, an imaging device that images reflected light from the measurement object irradiated by the light pattern to obtain image data, an image processing device that performs measurement of height at various coordinate positions on the measurement object based on the image data imaged by the imaging device, and a correction calculation device that corrects of a distortion that occurs due to a field angle of a lens of the imaging device relative to height data and coordinate data of an measurement object point on the measurement object measured by the image processing device, by correction based on at least a height data of the imaging device and an irradiation angle data of the pattern light irradiated on the measurement object.

    摘要翻译: 三维测量装置具有照射装置,其将具有条纹光强分布的光图案照射在测量对象上,成像装置对来自被照射的光图案的测量对象的反射光进行成像以获得图像数据,图像处理 基于由成像装置成像的图像数据,在测量对象上的各坐标位置处进行高度的测量的装置,以及校正计算装置,其校正由于成像装置相对的镜头的视场角而发生的失真 通过基于成像装置的至少高度数据和照射在测量对象上的图案光的照射角度数据进行校正来对由图像处理装置测量的测量对象点上的测量对象点的数据进行高度数据和坐标数据的校准。