发明申请
- 专利标题: INTEGRATED CIRCUIT DESIGN METHOD AND SYSTEM
- 专利标题(中): 集成电路设计方法与系统
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申请号: US13348850申请日: 2012-01-12
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公开(公告)号: US20130185684A1公开(公告)日: 2013-07-18
- 发明人: John E. Barwin , Amol A. Joshi , Baozhen Li , Michael R. Ouellette
- 申请人: John E. Barwin , Amol A. Joshi , Baozhen Li , Michael R. Ouellette
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
Disclosed is an integrated circuit design method that determines maximum direct currents for metal components and uses them as design constraints in the design flow in order to avoid/minimize electromigration failures. Short and long metal components are treated differently for purposes of establishing the design constraints. For a short metal component, the maximum direct current as a function of a given temperature for a given expected lifetime of the integrated circuit is determined, another maximum direct current is determined based on the Blech length, and the higher of these two is selected and used as the design constraint for that short metal component. For a long metal component, only the maximum direct current as a function of the given temperature for the given expected lifetime is determined and used as the design constraint. Also disclosed herein are associated system and program storage device embodiments for designing an integrated circuit.
公开/授权文献
- US08656325B2 Integrated circuit design method and system 公开/授权日:2014-02-18