发明申请
- 专利标题: SYSTEM AND METHOD FOR PIXELATED DETECTOR CALIBRATION
- 专利标题(中): 用于像素检测器校准的系统和方法
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申请号: US13360381申请日: 2012-01-27
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公开(公告)号: US20130193330A1公开(公告)日: 2013-08-01
- 发明人: Ashwin Ashok Wagadarikar , Ravindra Mohan Manjeshwar , Sergei Ivanovich Dolinsky
- 申请人: Ashwin Ashok Wagadarikar , Ravindra Mohan Manjeshwar , Sergei Ivanovich Dolinsky
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 主分类号: G01T1/202
- IPC分类号: G01T1/202 ; G01T1/164
摘要:
Present embodiments relate to the calibration of detectors having one or more arrays of pixelated detectors. According to an embodiment, a method includes detecting optical outputs generated by a plurality of scintillation crystals of a detector with an array of pixelated detectors, generating, with the array of pixelated detectors, respective signals indicative of the optical outputs, generating, from the respective signals, a unique energy spectrum correlated to each of the plurality of scintillation crystals, grouping subsets of the plurality of scintillation crystals into macrocrystals, determining a representative energy spectrum peak for each macrocrystal based on the respective energy spectra of the scintillation crystals in the macrocrystal, comparing a value of the representative energy spectrum peak for each macrocrystal with a target peak value, and adjusting an operating parameter of at least one pixelated detector in the array of pixelated detectors as a result of the comparison.
公开/授权文献
- US08809793B2 System and method for pixelated detector calibration 公开/授权日:2014-08-19
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