Invention Application
- Patent Title: SENSOR FAULT DETECTION SYSTEM AND METHOD
- Patent Title (中): 传感器故障检测系统及方法
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Application No.: US13747250Application Date: 2013-01-22
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Publication No.: US20130207665A1Publication Date: 2013-08-15
- Inventor: Abhishek Bandyopadhyay , Khiem Quang Nguyen
- Applicant: Abhishek Bandyopadhyay , Khiem Quang Nguyen
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
Fault detection techniques for control of sensor systems. A sensor control integrated circuit (“IC”) may include a fault detection system for coupling to the sensor supply lines. The system may detect faults for each of the sensor supply lines. The fault detection system may level shift sensor supply line signals from a first voltage domain to a second voltage domain appropriate for the fault detection system of the controller IC. The fault detection system may level shift source potential voltages from the first voltage domain to the second voltage domain to detect predetermined fault types. The fault detection system may compare the second domain voltages from the sensor supply lines to voltages representing predetermined fault types and may generate fault status indicators based on the comparison.
Public/Granted literature
- US09791493B2 Sensor fault detection system and method Public/Granted day:2017-10-17
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