Abstract:
A system for converting digital signals into analog signals using sigma-delta modulation and includes a signed thermometer encoder for converting a plurality of signed binary data received at the encoder into a plurality of signed thermometer data and a rotational dynamic element matching (DEM) arrangement for receiving the plurality of signed binary data and the plurality of signed thermometer data. The rotational DEM arrangement further includes a first barrel shifter for receiving a positive thermometer data at a cycle, the first barrel shifter having a first pointer indicating a starting position of next positive thermometer data, and a second barrel shifter for receiving a negative thermometer data at a cycle, the second shifter having a second pointer indicating a starting position of next negative thermometer data, wherein the first pointer is circularly shifted as a function of positive binary data and the second pointer is circularly shifted as a function of negative binary data.
Abstract:
A low voltage driver for a higher voltage LCD includes a plurality of LCD drive bias voltage input-terminals; an LCD drive voltage output terminal; an input transistor switching circuit having at least one switch for each LCD drive bias voltage for selecting one of the bias voltages; an output transistor switching circuit, responsive to the input transistor switching circuit, for applying the selected one of the bias voltages to the LCD drive voltage output terminal, the transistors of the switching circuits having a predetermined breakdown voltage; a level shifter for providing switching voltages counterpart to the plurality of bias voltages; a logic circuit for enabling the first transistor switching circuit to select a one of the bias voltages and applying a set of counterpart switching voltages to the input and output transistor switching circuits for connecting the selected one of the bias voltages to the output terminal and applying a set of switching voltages to the input and output switching circuits which limit the voltage across the transistor junctions in the switching circuit to less than the predetermined breakdown voltage.
Abstract:
A multibit flash quantizer circuit, such as included as a portion of delta-sigma conversion circuit, can be operated in a dynamic or configurable manner. Information indicative of at least one of an ADC input slew rate or a prior quantizer output code can be used to establish a flash quantizer conversion window. Within the selected conversion window, comparators in the quantizer circuit can be made active. Comparators outside the conversion window can be made dormant, such as depowered or biased to save power. An output from such dormant converters can be preloaded and latched. In this manner, full resolution is available without requiring that all comparator circuits within the quantizer remain active at all times.
Abstract:
Fault detection techniques for control of sensor systems. A sensor control integrated circuit (“IC”) may include a fault detection system for coupling to the sensor supply lines. The system may detect faults for each of the sensor supply lines. The fault detection system may level shift sensor supply line signals from a first voltage domain to a second voltage domain appropriate for the fault detection system of the controller IC. The fault detection system may level shift source potential voltages from the first voltage domain to the second voltage domain to detect predetermined fault types. The fault detection system may compare the second domain voltages from the sensor supply lines to voltages representing predetermined fault types and may generate fault status indicators based on the comparison.
Abstract:
A low-power, low-voltage feedback class AB operational amplifier is disclosed. The minimum supply voltage is one gate-source voltage and two saturation voltages. Currents on the output p-type and n-type transistors are monitored as part of the feedback loop control. Accurate monitoring is achieved by connecting current monitors directly to the corresponding voltage rail. Additional output stages may be selectively connected to the primary output stage to dynamically adjust to changes source conditions. Thus by connecting the appropriate number and type of additional output stages, continuous time adaptive power supply compensation is achieved. Both single ended and differential topologies are described.
Abstract:
Some or all of a comparator circuit of an analog-to-digital converter (ADC) circuit can be efficiently repurposed or reused for residue amplification for efficient noise-shaping, e.g., in a noise-shaping feedback configuration. A preamplifier portion of a comparator circuit in an oversampling ADC can be re-purposed to provide an amplifier to amplify or otherwise modify a residue left after the bit trials of a conversion cycle. The amplified or modified residue can then be used elsewhere, for example, for noise-shaping by applying a noise transfer function (NTF), a result of which can then be fed back (e.g., summed with the next sampled input at an input of the comparator circuit for use in the N bit trials of the next ADC cycle).
Abstract:
Embodiments of the present disclosure may provide a switching scheme for tri-level unit elements with ISI mitigation. A tri-level unit element may include a first and second current source and a plurality of switches arranged to form three circuit branches between the first and the second current source. The first circuit branch may include two switches connected in parallel between the first current source and a first output terminal and two switches connected in parallel between the second current source and the first output terminal. The second circuit branch may include two switches connected in parallel between the first current source and a second output terminal and two switches connected in parallel between the second current source and the second output terminal. The third circuit branch may include switches to couple the first current source and the second current source to a dump node.
Abstract:
Embodiments of the present disclosure may provide a switching scheme for tri-level unit elements with ISI mitigation. A tri-level unit element may include a first and second current source and a plurality of switches arranged to form three circuit branches between the first and the second current source. The first circuit branch may include two switches connected in parallel between the first current source and a first output terminal and two switches connected in parallel between the second current source and the first output terminal. The second circuit branch may include two switches connected in parallel between the first current source and a second output terminal and two switches connected in parallel between the second current source and the second output terminal. The third circuit branch may include switches to couple the first current source and the second current source to a dump node.
Abstract:
A low voltage driver for a higher voltage LCD includes a plurality of LCD drive bias voltage input terminals; an LCD drive voltage output terminal; an input transistor switching circuit having at least one switch for each LCD drive bias voltage for selecting one of the bias voltages; an output transistor switching circuit, responsive to the input transistor switching circuit, for applying the selected one of the bias voltages to the LCD drive voltage output terminal, the transistors of the switching circuits having a predetermined breakdown voltage; a level shifter for providing switching voltages counterpart to the plurality of bias voltages; a logic circuit for enabling the first transistor switching circuit to select a one of the bias voltages and applying a set of counterpart switching voltages to the input and output transistor switching circuits for connecting the selected one of the bias voltages to the output terminal and applying a set of switching voltages to the input and output switching circuits which limit the voltage across the transistor junctions in the switching circuit to less than the predetermined breakdown voltage.
Abstract:
A system for converting digital signals into analog signals using sigma-delta modulation and includes a signed thermometer encoder for converting a plurality of signed binary data received at the encoder into a plurality of signed thermometer data and a rotational dynamic element matching (DEM) arrangement for receiving the plurality of signed binary data and the plurality of signed thermometer data. The rotational DEM arrangement further includes a first barrel shifter for receiving a positive thermometer data at a cycle, the first barrel shifter having a first pointer indicating a starting position of next positive thermometer data, and a second barrel shifter for receiving a negative thermometer data at a cycle, the second shifter having a second pointer indicating a starting position of next negative thermometer data, wherein the first pointer is circularly shifted as a function of positive binary data and the second pointer is circularly shifted as a function of negative binary data.