发明申请
- 专利标题： REDUCING PERFORMANCE DEGRADATION IN BACKUP SEMICONDUCTOR CHIPS
- 专利标题（中）： 降低备用半导体芯片的性能降低
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申请号： US13396345申请日： 2012-02-14
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公开(公告)号： US20130212414A1公开(公告)日： 2013-08-15
- 发明人: Aditya Bansal , Manjul Bhushan , Keith A. Jenkins , Jae-Joon Kim , Barry P. Linder , Kai Zhao
- 申请人： Aditya Bansal , Manjul Bhushan , Keith A. Jenkins , Jae-Joon Kim , Barry P. Linder , Kai Zhao
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 主分类号： G06F1/32
- IPC分类号： G06F1/32
摘要：
A system has at least a first circuit portion and a second circuit portion. The first circuit portion is operated at normal AC frequency. The second circuit portion is operated in a back-up mode at low AC frequency, such that the second circuit portion can rapidly come-online but has limited temperature bias instability degradation. The second circuit portion can then be brought on-line and operated at the normal AC frequency. A system including first and second circuit portions and a control unit, as well as a computer program product, are also provided.