发明申请
US20130241530A1 Measuring Device for Determining and/or Monitoring at Least One Process Variable
审中-公开
用于确定和/或监控至少一个过程变量的测量装置
- 专利标题: Measuring Device for Determining and/or Monitoring at Least One Process Variable
- 专利标题(中): 用于确定和/或监控至少一个过程变量的测量装置
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申请号: US13885757申请日: 2011-11-15
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公开(公告)号: US20130241530A1公开(公告)日: 2013-09-19
- 发明人: Armin Wernet , Kaj Uppenkamp , Franco Ferraro , Wolfgang Brutschin
- 申请人: Armin Wernet , Kaj Uppenkamp , Franco Ferraro , Wolfgang Brutschin
- 申请人地址: DE Maulburg
- 专利权人: Endress + Hauser GmbH + Co. KG
- 当前专利权人: Endress + Hauser GmbH + Co. KG
- 当前专利权人地址: DE Maulburg
- 优先权: DE102010044180.5 20101119
- 国际申请: PCT/EP2011/070100 WO 20111115
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
A measuring device for determining and/or monitoring at least one process variable, comprising: a sensor unit; a first electronics unit which has a first microcontroller, and a second electronics unit which has a second microcontroller, and which is connected with the first electronics unit via a galvanically isolated transmission unit for energy- and data transmission. The first microcontroller produces at least one signal, which can vary in at least one characteristic, and supplies the signal to the transmission unit, that the signal controls the energy- and data transmission, that the first microcontroller and/or the second microcontroller determines at least one current operating parameter, and that the first microcontroller sets at least one characteristic of the signal as a function of the operating parameter.
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