A system and computer implemented method for managing quality processing of electronic devices. A number of electronic devices are received for processing. The number of electronic devices are randomly sampled utilizing sampling thresholds to determine issues with the number of electronic devices. The sampling thresholds are automatically adjusted in real-time in response to results of the sampling. Failure processing is implemented in response to one or more of the number of electronic devices failing the sampling. The information associated with the processing of the number of electronic devices in recorded in one or more databases.