Invention Application
- Patent Title: APPARATUS AND METHOD FOR MEASURING THERMAL DIFFUSIVITY
- Patent Title (中): 用于测量热差异的装置和方法
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Application No.: US13524824Application Date: 2012-06-15
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Publication No.: US20130266038A1Publication Date: 2013-10-10
- Inventor: Chih-Chao Shih , Jin-Bao Wu , Ming-Sheng Leu
- Applicant: Chih-Chao Shih , Jin-Bao Wu , Ming-Sheng Leu
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Priority: TW101112459 20120409
- Main IPC: G01N25/20
- IPC: G01N25/20

Abstract:
An apparatus for measuring thermal diffusivity includes a Raman spectroscope, a heating device, and a signal analyzing unit. The Raman spectroscope is utilized to measure a Raman scattering intensity of different sites of a film to be measured. The heating device is utilized to provide a controllable thermal driving wave. The signal analyzing unit is utilized to analyze the Raman scattering intensity from the Raman spectroscope and the thermal driving wave so as to evaluate the thermal diffusivity of the film to be measured.
Public/Granted literature
- US08708557B2 Apparatus for measuring thermal diffusivity Public/Granted day:2014-04-29
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