Invention Application
US20130266119A1 MICRO-FOCUS X-RAY GENERATION APPARATUS AND X-RAY IMAGING APPARATUS 审中-公开
微型X射线发生装置和X射线成像装置

  • Patent Title: MICRO-FOCUS X-RAY GENERATION APPARATUS AND X-RAY IMAGING APPARATUS
  • Patent Title (中): 微型X射线发生装置和X射线成像装置
  • Application No.: US13857749
    Application Date: 2013-04-05
  • Publication No.: US20130266119A1
    Publication Date: 2013-10-10
  • Inventor: Osamu TaniguchiTakao Ogura
  • Applicant: CANON KABUSHIKI KAISHA
  • Priority: JP2012-089700 20120410
  • Main IPC: H01J35/14
  • IPC: H01J35/14 G01N23/04
MICRO-FOCUS X-RAY GENERATION APPARATUS AND X-RAY IMAGING APPARATUS
Abstract:
A transmission type micro-focus X-ray generation apparatus includes an electron reflector, an electron passage surrounded by the electron reflector, an electron source, and a target. X-rays are generated by irradiating the target with electrons that have been emitted from the electron source and that have passed through the electron passage. The electron passage has a conical shape having a cross-sectional area that increases from an outlet on the target side toward an inlet on the electron source side. A material of the target is molybdenum, tantalum, or tungsten. The atomic number of a material of the electron reflector is greater than or equal to the atomic number of the material of the target.
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