发明申请
- 专利标题: PATTERN MATCHING DEVICE AND COMPUTER PROGRAM
- 专利标题(中): 模式匹配设备和计算机程序
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申请号: US14001376申请日: 2011-12-12
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公开(公告)号: US20140016854A1公开(公告)日: 2014-01-16
- 发明人: Wataru Nagatomo , Yuichi Abe , Keisuke Nakashima
- 申请人: Wataru Nagatomo , Yuichi Abe , Keisuke Nakashima
- 申请人地址: JP Tokyo
- 专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2011-039187 20110225
- 国际申请: PCT/JP2011/006906 WO 20111212
- 主分类号: G06T7/00
- IPC分类号: G06T7/00
摘要:
The present invention aims at providing a pattern matching device that conducts pattern matching on an image including a plurality of regions having different features with high precision, such as a pattern image including a plurality of layers.In order to achieve the above object, the present invention proposes a pattern matching device that executes pattern matching on a target image with the use of a template formed on the basis of design data or a picked-up image, which executes the pattern matching on a first target image with the use of a first template including a plurality of different patterns, creates a second target image with the exclusion of information on a region including a specific pattern from the first target image, and determines the degree of similarity between the second target image, and a second template including pattern information other than the specific pattern.
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