Invention Application
- Patent Title: Test Selection
- Patent Title (中): 测试选择
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Application No.: US13552665Application Date: 2012-07-19
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Publication No.: US20140025997A1Publication Date: 2014-01-23
- Inventor: Andre Heiper , Aharon Kupershtok , Yaakov Yaari
- Applicant: Andre Heiper , Aharon Kupershtok , Yaakov Yaari
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Main IPC: G06F11/36
- IPC: G06F11/36

Abstract:
Computer-implemented method, computerized apparatus and a computer program product for test selection. The computer-implemented method comprising: obtaining a test suite comprising a plurality of tests for a Software Under Test (SUT); and selecting a subset of the test suite, wherein the subset provides coverage of the SUT that correlates to a coverage by a workload of the SUT, wherein the workload defines a set of input events to the SUT thereby defining portions of the SUT that are to be invoked during execution.
Public/Granted literature
- US08850270B2 Test selection Public/Granted day:2014-09-30
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