发明申请
- 专利标题: METHOD AND SYSTEM FOR GAS TEMPERATURE MEASUREMENT
- 专利标题(中): 气温测量方法与系统
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申请号: US13563024申请日: 2012-07-31
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公开(公告)号: US20140033737A1公开(公告)日: 2014-02-06
- 发明人: Guanghua Wang , Nirm Velumylum Nirmalan , Todd Garrett Wetzel , Ronald Scott Bunker , Robert Michael Zacharias , Shawn David Wehe , Robert David Briggs , Jonathan Edward Slepski
- 申请人: Guanghua Wang , Nirm Velumylum Nirmalan , Todd Garrett Wetzel , Ronald Scott Bunker , Robert Michael Zacharias , Shawn David Wehe , Robert David Briggs , Jonathan Edward Slepski
- 申请人地址: US NY Schenectady
- 专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人地址: US NY Schenectady
- 主分类号: G01J5/00
- IPC分类号: G01J5/00 ; F02C7/00
摘要:
A temperature measurement system includes at least one filament configured to emit thermal radiation in a relatively broad and substantially continuous wavelength band that is at least partially representative of a temperature of the at least one filament. The system also includes an optical system configured to receive at least a portion of the thermal radiation emitted from the filament. The optical system includes a wavelength splitting device configured to split the emitted thermal radiation into at least one relatively narrow wavelength band of thermal radiation. The optical system also includes a detector array configured to receive the at least one relatively narrow wavelength band of thermal radiation and to generate electrical signals at least partially representative of the received thermal radiation. The temperature measurement system further includes a controller communicatively coupled to the detector array. The controller is configured to transform the generated electrical signals to a temperature indication using a predetermined conversion module.
公开/授权文献
- US09335215B2 Method and system for gas temperature measurement 公开/授权日:2016-05-10
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