Invention Application
US20140036570A1 OPERATING METHOD FOR MEMORY DEVICE AND MEMORY ARRAY AND OPERATING METHOD FOR THE SAME
有权
用于存储器件和存储器阵列的操作方法及其操作方法
- Patent Title: OPERATING METHOD FOR MEMORY DEVICE AND MEMORY ARRAY AND OPERATING METHOD FOR THE SAME
- Patent Title (中): 用于存储器件和存储器阵列的操作方法及其操作方法
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Application No.: US13567750Application Date: 2012-08-06
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Publication No.: US20140036570A1Publication Date: 2014-02-06
- Inventor: Feng-Min Lee , Yu-Yu Lin , Ming-Hsiu Lee
- Applicant: Feng-Min Lee , Yu-Yu Lin , Ming-Hsiu Lee
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee Address: TW Hsinchu
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C11/00

Abstract:
An operating method for a memory device and a memory array and an operating method for the same are provided. The operating method for the memory device comprises following steps. A memory device is made being in a set state. A method for making the memory device being in the set state comprises applying a first bias voltage to the memory device. The memory device in the set state is read. A method for reading the memory device in the set state comprises applying a second bias voltage to the memory device. A recovering bias voltage is applied to the memory device. The step for applying the recovering bias voltage is performed after the step for applying the first bias voltage or the step for applying the second bias voltage.
Public/Granted literature
- US08824188B2 Operating method for memory device and memory array and operating method for the same Public/Granted day:2014-09-02
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