Invention Application
- Patent Title: Device And Method For Characterizing A Light Beam
- Patent Title (中): 用于表征光束的装置和方法
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Application No.: US14124781Application Date: 2012-06-08
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Publication No.: US20140098367A1Publication Date: 2014-04-10
- Inventor: Fabien Quere
- Applicant: Fabien Quere
- Applicant Address: FR Paris
- Assignee: Commissariat A L'Energie Atomique et aux Energies Alternatives
- Current Assignee: Commissariat A L'Energie Atomique et aux Energies Alternatives
- Current Assignee Address: FR Paris
- Priority: FR1155185 20110614
- International Application: PCT/IB2012/052910 WO 20120608
- Main IPC: G01J3/45
- IPC: G01J3/45

Abstract:
Method of characterizing a light beam (FL) comprising the steps consisting in: a) disposing the input ends (EE1-EE11) of N>3 optical fibres (F01-F011) on the path of said light beam, in such a way that a respective portion of said beam is coupled and propagates in each optical fibre and is emitted from its output end (ES1-ES11) so as to form a respective secondary beam; b) introducing an angular spectral dispersion into said secondary beams by means of at least one dispersive element (RD); c) propagating the dispersed secondary beams in such a way that they overlap to form an interferogram; d) acquiring an image of said interferogram; and e) extracting from said image of said interferogram an item of information relating to the spatial variation of the phase of said light beam at a plurality of wavelengths. Device for the implementation of such a method.
Public/Granted literature
- US09243957B2 Device and method for characterizing a light beam Public/Granted day:2016-01-26
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