发明申请
US20140103987A1 PHASE DIFFERENCE QUANTIZATION CIRCUIT, DELAY VALUE CONTROL CIRCUIT THEREOF, AND DELAY CIRCUIT 有权
相位差定量电路,延迟值控制电路及延迟电路

  • 专利标题: PHASE DIFFERENCE QUANTIZATION CIRCUIT, DELAY VALUE CONTROL CIRCUIT THEREOF, AND DELAY CIRCUIT
  • 专利标题(中): 相位差定量电路,延迟值控制电路及延迟电路
  • 申请号: US14093364
    申请日: 2013-11-29
  • 公开(公告)号: US20140103987A1
    公开(公告)日: 2014-04-17
  • 发明人: Dong-Suk SHIN
  • 申请人: SK hynix Inc.
  • 申请人地址: KR Gyeonggi-do
  • 专利权人: SK hynix Inc.
  • 当前专利权人: SK hynix Inc.
  • 当前专利权人地址: KR Gyeonggi-do
  • 优先权: KR10-2011-0146281 20111229
  • 主分类号: H03K5/14
  • IPC分类号: H03K5/14
PHASE DIFFERENCE QUANTIZATION CIRCUIT, DELAY VALUE CONTROL CIRCUIT THEREOF, AND DELAY CIRCUIT
摘要:
A delay value control circuit of a phase difference quantization circuit, wherein the phase difference quantization circuit has first to Nth (N is an integer equal to or greater than 2) delay units with binary weights. The delay value control circuit includes a replica delay unit replicating an Ath (2≦A≦N) delay unit; and a delay control unit configured to compare a phase of a first output signal generated from delaying an input signal with an A−1th delay unit and a phase of a second output signal generated from delaying the input signal with the Ath delay unit and the replica delay unit and configured to control a delay value of the Ath delay unit using a comparison result.
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