Invention Application
US20140116157A1 METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STABILITY
有权
方法,测量雪花结构和稳定性的装置和系统
- Patent Title: METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STABILITY
- Patent Title (中): 方法,测量雪花结构和稳定性的装置和系统
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Application No.: US14063973Application Date: 2013-10-25
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Publication No.: US20140116157A1Publication Date: 2014-05-01
- Inventor: James Loren CHRISTIAN , Samuel Tileston WHITTEMORE , Brinton J.W. MARKLE
- Applicant: AvaTech, Inc.
- Applicant Address: US MA Cambridge
- Assignee: AVATECH, INC.
- Current Assignee: AVATECH, INC.
- Current Assignee Address: US MA Cambridge
- Main IPC: G01B21/18
- IPC: G01B21/18 ; G01N3/00

Abstract:
The present inventions relate generally to methods, apparatus and systems for measuring snow stability and structure which may be used to assess avalanche risk. The disclosed apparatus includes a sensing unit configured to sense a resistance to penetration as the sensing unit is being driven into a layer of snow. The disclosed apparatus may also be configured to take other environmental measurements, including temperature, humidity, grain size, slope aspect and inclination. Methods and apparatus are also disclosed for generating a profile of snow layer hardness according to depth based on the sensed resistance to penetration and identifying areas of concern which may indicate an avalanche risk. Systems and apparatus are also disclosed for sharing the generated profiles among a plurality of users via a central server, and for evaluating an avalanche risk at a geographic location.
Public/Granted literature
- US09057804B2 Methods, apparatus and systems for measuring snow structure and stability Public/Granted day:2015-06-16
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