发明申请
US20140116162A1 METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STABILITY
审中-公开
方法，测量雪花结构和稳定性的装置和系统
- 专利标题： METHODS, APPARATUS AND SYSTEMS FOR MEASURING SNOW STRUCTURE AND STABILITY
- 专利标题（中）： 方法，测量雪花结构和稳定性的装置和系统
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申请号： US14063557申请日： 2013-10-25
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公开(公告)号： US20140116162A1公开(公告)日： 2014-05-01
- 发明人: James Loren CHRISTIAN , Samuel Tileston WHITTEMORE , Brinton Johnston Wadsworth MARKLE
- 申请人： AvaTech, Inc.
- 申请人地址： US MA Cambridge
- 专利权人： AvaTech, Inc.
- 当前专利权人： AvaTech, Inc.
- 当前专利权人地址： US MA Cambridge
- 主分类号： G01N17/00
- IPC分类号： G01N17/00
摘要：
The present inventions relate generally to methods, apparatus and systems for measuring snow stability and structure which may be used to assess avalanche risk. The disclosed apparatus includes a sensing unit configured to sense a temperature of a layer of snow as the sensing unit is being driven into the layer of snow. The disclosed apparatus may also be configured to take other environmental measurements, including resistance to penetration, humidity, grain size, slope aspect and inclination. Methods and apparatus are also disclosed for generating a profile of snow layer temperature according to depth based on the sensed temperature. Systems and apparatus are also disclosed for sharing the generated profiles among a plurality of users via a central server, and for evaluating an avalanche risk at a geographic location.