发明申请
- 专利标题: PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
- 专利标题(中): 等离子体加工设备和等离子体处理方法
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申请号: US14233276申请日: 2012-06-29
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公开(公告)号: US20140154832A1公开(公告)日: 2014-06-05
- 发明人: Shogo Okita , Syouzou Watanabe
- 申请人: Shogo Okita , Syouzou Watanabe
- 优先权: JP2011-163228 20110726
- 国际申请: PCT/JP2012/004223 WO 20120629
- 主分类号: H01L31/18
- IPC分类号: H01L31/18 ; H01L21/67
摘要:
A dry etching apparatus includes a tray for conveying substrates. The tray has substrate housing holes as through holes each capable of housing the three substrates. The substrates are supported by a substrate support section protruding from a hole wall of each of the substrate housing holes. A stage is provided in a chamber in which plasma is generated. The stage includes substrate installation sections to be inserted from a lower surface side of the tray to the substrate housing holes so that lower surfaces of the plurality of the substrates transferred from the substrate support section are installed on substrate installation surfaces that are their upper end surfaces. High shape controllability and favorable productivity for the angular substrate can be implemented while preventing increased in size of the apparatus.
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