发明申请
US20140159188A1 Application of Reduced Dark Current Photodetector 审中-公开
减少暗电流检测器的应用

  • 专利标题: Application of Reduced Dark Current Photodetector
  • 专利标题(中): 减少暗电流检测器的应用
  • 申请号: US13964883
    申请日: 2013-08-12
  • 公开(公告)号: US20140159188A1
    公开(公告)日: 2014-06-12
  • 发明人: Shimon Maimon
  • 申请人: Shimon Maimon
  • 主分类号: H01L27/146
  • IPC分类号: H01L27/146
Application of Reduced Dark Current Photodetector
摘要:
A IDCA system with internal nBn photo-detector comprising: a photo-absorbing layer comprising an n-doped semiconductor exhibiting valence band energy level; a barrier layer, a first side of the barrier layer adjacent a first side of the photo-absorbing layer, the barrier layer exhibiting a valence band energy level substantially equal to the valence band energy level of the doped semiconductor of the photo absorbing layer; and a contact area comprising a doped semiconductor, the contact area being adjacent a second side of the barrier layer opposing the first side, the barrier layer exhibiting a thickness and conductance band gap sufficient to prevent tunneling of majority carriers from the photo-absorbing layer to the contact area, blocking the flow of thermalized majority carriers from the photo-absorbing layer to the contact area. Alternatively, a p-doped semiconductor is utilized, equalizing barrier conductance band energy levels and photo-absorbing layers.
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