Invention Application
US20140166894A1 CHARGED PARTICLE BEAM LENS AND EXPOSURE APPARATUS USING THE SAME
审中-公开
充电颗粒光束和曝光装置使用它
- Patent Title: CHARGED PARTICLE BEAM LENS AND EXPOSURE APPARATUS USING THE SAME
- Patent Title (中): 充电颗粒光束和曝光装置使用它
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Application No.: US14005187Application Date: 2012-03-14
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Publication No.: US20140166894A1Publication Date: 2014-06-19
- Inventor: Takahisa Kato , Yutaka Setomoto
- Applicant: Takahisa Kato , Yutaka Setomoto
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Priority: JP2011-056811 20110315
- International Application: PCT/JP2012/001779 WO 20120314
- Main IPC: G21K1/087
- IPC: G21K1/087

Abstract:
An electrostatic charged particle beam lens includes an electrode including a flat plate having a first surface having a normal line extending in a direction of an optical axis and a second surface opposite to the first surface, the electrode having a through-hole extending from the first surface to the second surface. A circularity in a first region that is on the first surface side and a circularity in a second region that is on the second surface side are each better than a circularity in a third region that is a region in the electrode disposed between the first surface and the second surface.
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