Invention Application
- Patent Title: NON REAL-TIME METROLOGY DATA MANAGEMENT
- Patent Title (中): 非实时计量数据管理
-
Application No.: US13717462Application Date: 2012-12-17
-
Publication No.: US20140173630A1Publication Date: 2014-06-19
- Inventor: Samuel Lee Whitfield , Gregory Shane Barrett , Michael Clarence Miller , Kevin David Guthrie
- Applicant: ITRON, INC.
- Applicant Address: US WA Liberty Lake
- Assignee: Itron, Inc.
- Current Assignee: Itron, Inc.
- Current Assignee Address: US WA Liberty Lake
- Main IPC: G06F9/54
- IPC: G06F9/54

Abstract:
The techniques described herein implement an operating system that can reliably process time sensitive information in non real-time manner. Thus, the operating system described herein is capable of processing an instance of time sensitive input during a time period after the instance of time sensitive input is received (e.g., at a future point in time). To accomplish this, the techniques timestamp each instance of time sensitive input when it is received at a device. The techniques then store the timestamped instance of time sensitive input in a temporary queue, and make the timestamped instance available to the operating system at a time period after the time period when it is received, as indicated by the timestamp. Additional techniques described herein prioritize the activation of a driver configured to receive the time sensitive information during a boot sequence or a reboot sequence.
Public/Granted literature
- US09027035B2 Non real-time metrology data management Public/Granted day:2015-05-05
Information query