Invention Application
US20140328586A1 SIGNAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS 有权
极化多信号信号的信号变形测量

  • Patent Title: SIGNAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS
  • Patent Title (中): 极化多信号信号的信号变形测量
  • Application No.: US14268144
    Application Date: 2014-05-02
  • Publication No.: US20140328586A1
    Publication Date: 2014-11-06
  • Inventor: Gang HEDaniel GARIEPYMats SKOLD
  • Applicant: EXFO Inc.
  • Applicant Address: CA Quebec
  • Assignee: EXFO Inc.
  • Current Assignee: EXFO Inc.
  • Current Assignee Address: CA Quebec
  • Main IPC: H04B10/079
  • IPC: H04B10/079 H04J14/06
SIGNAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS
Abstract:
There is provided a method and an apparatus for determining quality parameters on a polarization-multiplexed optical signal based on an analysis of the power spectral density of the Signal-Under-Test (SUT). The method is predicated upon knowledge of the spectral shape of the signal in the absence of significant noise or spectral deformation. This knowledge is provided by a reference optical spectrum trace. Based on this knowledge and under the assumption that ASE noise level is approximately constant in wavelength over a given spectral range, the spectral deformation of the signal contribution of the SUT may be estimated using a comparison of the spectral variations of the optical spectrum trace of the SUT with that of the reference optical spectrum trace.
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