Invention Application
- Patent Title: SIGNAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS
- Patent Title (中): 极化多信号信号的信号变形测量
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Application No.: US14268144Application Date: 2014-05-02
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Publication No.: US20140328586A1Publication Date: 2014-11-06
- Inventor: Gang HE , Daniel GARIEPY , Mats SKOLD
- Applicant: EXFO Inc.
- Applicant Address: CA Quebec
- Assignee: EXFO Inc.
- Current Assignee: EXFO Inc.
- Current Assignee Address: CA Quebec
- Main IPC: H04B10/079
- IPC: H04B10/079 ; H04J14/06

Abstract:
There is provided a method and an apparatus for determining quality parameters on a polarization-multiplexed optical signal based on an analysis of the power spectral density of the Signal-Under-Test (SUT). The method is predicated upon knowledge of the spectral shape of the signal in the absence of significant noise or spectral deformation. This knowledge is provided by a reference optical spectrum trace. Based on this knowledge and under the assumption that ASE noise level is approximately constant in wavelength over a given spectral range, the spectral deformation of the signal contribution of the SUT may be estimated using a comparison of the spectral variations of the optical spectrum trace of the SUT with that of the reference optical spectrum trace.
Public/Granted literature
- US09596027B2 Signal deformation measurement on polarization-multiplexed signals Public/Granted day:2017-03-14
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