SIGNAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS
    1.
    发明申请
    SIGNAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS 有权
    极化多信号信号的信号变形测量

    公开(公告)号:US20140328586A1

    公开(公告)日:2014-11-06

    申请号:US14268144

    申请日:2014-05-02

    Applicant: EXFO Inc.

    CPC classification number: H04B10/07953 H04J14/06

    Abstract: There is provided a method and an apparatus for determining quality parameters on a polarization-multiplexed optical signal based on an analysis of the power spectral density of the Signal-Under-Test (SUT). The method is predicated upon knowledge of the spectral shape of the signal in the absence of significant noise or spectral deformation. This knowledge is provided by a reference optical spectrum trace. Based on this knowledge and under the assumption that ASE noise level is approximately constant in wavelength over a given spectral range, the spectral deformation of the signal contribution of the SUT may be estimated using a comparison of the spectral variations of the optical spectrum trace of the SUT with that of the reference optical spectrum trace.

    Abstract translation: 提供了一种基于对测试信号(SUT)的功率谱密度的分析来确定偏振复用光信号质量参数的方法和装置。 该方法基于在没有显着噪声或光谱变形的情况下对信号的光谱形状的了解。 该知识由参考光谱轨迹提供。 基于这一知识,并假设ASE噪声水平在给定光谱范围内的波长近似恒定,则SUT的信号贡献的光谱变形可以使用光谱轨迹的光谱变化的比较来估计 SUT与参考光谱图谱相同。

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