发明申请
- 专利标题: SINGLE LAYER 3D TRACKING SEMICONDUCTOR DETECTOR
- 专利标题(中): 单层三维跟踪半导体探测器
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申请号: US14346206申请日: 2011-09-21
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公开(公告)号: US20140332691A1公开(公告)日: 2014-11-13
- 发明人: Michael Campbell , Thilo Michel , Jan Jakubek
- 申请人: Michael Campbell , Thilo Michel , Jan Jakubek
- 申请人地址: CH Geneva DE Erlangen CZ Prague
- 专利权人: CERN - EUROPEAN ORGANIZATION FOR NUCLEAR RESEARCH,Friedrich-Alexander-Universitat Erlangen-Numberg,Czech Technical University in Prague Institute of Experimental and Applied Physics
- 当前专利权人: CERN - EUROPEAN ORGANIZATION FOR NUCLEAR RESEARCH,Friedrich-Alexander-Universitat Erlangen-Numberg,Czech Technical University in Prague Institute of Experimental and Applied Physics
- 当前专利权人地址: CH Geneva DE Erlangen CZ Prague
- 国际申请: PCT/EP2011/004733 WO 20110921
- 主分类号: G01T1/29
- IPC分类号: G01T1/29 ; G01T1/24
摘要:
The present invention relates to a pixel detector (10), comprising a semiconductor sensor layer (12), in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y-plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer (14) connected to said semiconductor layer (12), said read-out electronics layer (14) comprising an array of read-out circuits (20) for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer (12). The neighbouring read-out circuits (20) are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighbouring read-out circuits (20). The time difference information is indicative of a difference in the Z-components of the locations of charge generations in the corresponding neighbouring sensor volumes caused by a particle trajectory that is inclined with respect to the X-Y-plane.
公开/授权文献
- US09297912B2 Single layer 3D tracking semiconductor detector 公开/授权日:2016-03-29
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