Invention Application
- Patent Title: OPTICAL MEASURING APPARATUS
- Patent Title (中): 光学测量装置
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Application No.: US14277351Application Date: 2014-05-14
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Publication No.: US20140340694A1Publication Date: 2014-11-20
- Inventor: Shinji FUKUDA , Ryoichi IMAIZUMI
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Priority: JP2013-105906 20130520
- Main IPC: G01B11/08
- IPC: G01B11/08

Abstract:
An optical measuring apparatus includes a light emitter, a scanner, a polarizing plate, a photoreceiver, and a CPU. The light emitter emits a laser beam. The scanner uses the laser beam emitted from the light emitter and scans a measurement region where a work piece is placed. The polarizing plate allows passage for only a laser beam, among the laser beams fired by the scanner, directed orthogonally to an emission direction of the laser beam and an axis direction of the work piece. The photoreceiver receives the laser beam that has passed through the measurement region and the polarizing plate. The CPU calculates a dimension of the work piece from a pattern of light and dark in a scan direction, the pattern being obtained by the photoreceiver.
Public/Granted literature
- US09423241B2 Optical measuring apparatus Public/Granted day:2016-08-23
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