Invention Application
- Patent Title: Electromagnetic Noise Analysis Method and Device
- Patent Title (中): 电磁噪声分析方法与装置
-
Application No.: US14370433Application Date: 2013-02-06
-
Publication No.: US20140372092A1Publication Date: 2014-12-18
- Inventor: Hiroki Funato , Takashi Suga , Yoshiyuki Tsuchie , Satoshi Nakamura
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Chiyoda-ku, Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Chiyoda-ku, Tokyo
- Priority: JP2012-051146 20120308
- International Application: PCT/JP2013/052656 WO 20130206
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
An object of the present invention is to provide an EMC design technique of a device including an electronic device mounted therein for implementing noise amount analysis of a system in which individual electronic devices are combined. A housing model is acquired, component models are selected and acquire, the acquired component models are connected using a wire, the acquired component models are arranged in the acquired housing model, the arranged component models connected using the wire is driven to generate electromagnetic noise from the component models and the wire, the generated electromagnetic noise is propagated in the housing model to calculate a noise amount, and an output process of outputting data of the calculated noise amount is performed. Thus, even in the system in which a plurality of electronic devices are combined, electromagnetic noise analysis of the system can be easily performed, and a noise reduction design can be supported.
Public/Granted literature
- US09805147B2 Electromagnetic noise analysis method and device Public/Granted day:2017-10-31
Information query