发明申请
US20150015296A1 TEST STRUCTURE, ARRAY SUBSTRATE HAVING THE SAME AND METHOD OF MEASURING SHEET RESISTANCE USING THE SAME
有权
测试结构，具有该结构的阵列基板和使用该测量结构的测量板电阻的方法
- 专利标题： TEST STRUCTURE, ARRAY SUBSTRATE HAVING THE SAME AND METHOD OF MEASURING SHEET RESISTANCE USING THE SAME
- 专利标题（中）： 测试结构，具有该结构的阵列基板和使用该测量结构的测量板电阻的方法
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申请号： US14084965申请日： 2013-11-20
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公开(公告)号： US20150015296A1公开(公告)日： 2015-01-15
- 发明人: JONG-YUN KIM , Jin-Taek Kim , Cheol-Ho Yu , Bong-Won Lee
- 申请人： Samsung Display Co., Ltd.
- 申请人地址： KR Yongin-City
- 专利权人： Samsung Display Co., Ltd.
- 当前专利权人： Samsung Display Co., Ltd.
- 当前专利权人地址： KR Yongin-City
- 优先权： KR10-2013-0082557 20130715
- 主分类号： G09G3/00
- IPC分类号： G09G3/00
摘要：
A test structure includes a terminal pattern, a first extending part, a second extending part and a measuring part. The terminal pattern includes a first terminal part, a second terminal part, a third terminal part and a fourth terminal part sequentially disposed and spaced apart from each other in a first direction. The first extending part is connected to the first terminal part and the second terminal part. The first extending part extends in a second direction crossing the first direction. The second extending part is connected to the third terminal part and the fourth terminal part. The second extending part extends in the second direction. The measuring part partially overlaps the first extending part and the second extending part.
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