发明申请
- 专利标题: THIN FILM TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
- 专利标题(中): 薄膜晶体管及其制造方法
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申请号: US14162873申请日: 2014-01-24
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公开(公告)号: US20150034942A1公开(公告)日: 2015-02-05
- 发明人: Hyun-suk KIM , Sun-jae KIM , Tae-sang KIM , Myung-kwan RYU , Joon-seok PARK , Kyoung-seok SON
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: KR Suwon-Si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-Si
- 优先权: KR10-2013-0092667 20130805
- 主分类号: H01L29/786
- IPC分类号: H01L29/786 ; H01L29/66
摘要:
According to example embodiments, a thin film transistor (TFT) includes a channel layer including zinc, nitrogen, and oxygen; an etch stop layer on the channel layer; source and drain electrodes respectively contacting both ends of the channel layer; a gate electrode corresponding to the channel layer; and a gate insulating layer between the channel layer and the gate electrode. The etch stop layer includes fluorine. The channel layer may be on the gate electrode.
公开/授权文献
- US09087907B2 Thin film transistor and method of manufacturing the same 公开/授权日:2015-07-21
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